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| Description | Thanks to its leading-edge techniques and instruments operated by highly-specialized scientists, the Analysis Platform of the CRP-GL is able to characterize any type of material or surface, regardless of its nature (metal, ceramic;, glass, polymer, composite, semi-conductors, biological, ….) and its phase (solid or liquid, composite, thin or thick layers, powders, …). The CRP-GL also offers its expertise in materials science, chemistry and physics, and a comprehensive range of data interpretation and assessment tools that allow one to cater to all aspects of materials’, surfaces’ and interfaces’ characterization. This characterization is performed with instruments such as dynamic and static Secondary Ion Mass Spectrometry (SIMS), Auger Electron and X-ray Photoelectron Spectroscopies (AES - XPS), Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), X-Ray Diffractometry (XRD), Scanning Probe Microscopy (SPM), Fourier Transform Infrared Spectroscopy (FTIR) and High-Resolution Mass Spectrometry using various ionization techniques (ESI, APCI, NSI, AP-MALDI, or plasma-based ion sources). |
| URL | http://www.lippmann.lu |
| Status | Operational since 1992 |
| Scientific Domains | Material Sciences and Analytical Facilities |
| RI Categorization | Analytical Facilities |
| Location | 41, rue du Brill, Belvaux, 4422, Luxembourg |
| MERIL URL | http://portal.meril.eu/meril/view/facilitys/15783 |
